Question

Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?

(a) Auger electron spectroscopy

(b) Electron impact spectroscopy

(c) Electron spectroscopy for chemical analysis

(d) Secondary ion mass spectroscopy

This question was addressed to me in a national level competition.

My doubt stems from Surface Spectroscopic Techniques in chapter Electron and Ion Spectrometers of Analytical Instrumentation

Answer 1

The correct option is (c) Electron spectroscopy for chemical analysis

To explain I would say: Electron spectroscopy for chemical analysis using soft X-rays to eject electrons from inner shell orbitals. It is a type of electron spectroscopy.