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Which of the following is used to measure macro-circuit components in UMM?

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Which of the following is used to measure macro-circuit components in UMM?

(a) Telescope

(b) Microscope

(c) Probe tip

(d) Capstan

This question was addressed to me in my homework.

I'm obligated to ask this question of Universal Measuring Machine topic in chapter Measuring Machines & Total Quality Management of Engineering Metrology

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Correct answer is (b) Microscope

For explanation I would say: For measuring the location of small holes, a microscope is used and also for parts which are damaged by physical contact. Parts like components of macro-circuit, which doesn’t have reference surfaces against which an indicator probe-tip may register, can be measured by a microscope.

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