Which of the following methods utilizes the emission of low energy electrons in a process?
(a) Auger electron spectroscopy
(b) Electron impact spectroscopy
(c) Electron spectroscopy for chemical analysis
(d) Secondary ion mass spectroscopy
I had been asked this question in quiz.
Origin of the question is Surface Spectroscopic Techniques topic in portion Electron and Ion Spectrometers of Analytical Instrumentation