Question

A breakdown effect that occurs in modern devices at low voltages (of around 20 V) is

(a) Weak avalanche

(b) Strong avalanche

(c) Weak storm

(d) Punch-through

The question was posed to me during an online interview.

Query is from The Body Effect in section MOS Field Effect Transistors (MOSFETs) of Electronic Devices & Circuits

Answer 1

The correct option is (d) Punch-through

For explanation I would say: Punch-through occurs in devices with relatively short channels when the drain voltage is increased to the point that the depletion region surrounding the drain region extends through the channel to the source. The drain current then increases rapidly. Normally, punch-through does not result in permanent damage to the device.