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Which is also called stuck-at model?

(a) byte pattern

(b) parity pattern

(c) bit pattern

(d) test pattern

The question was posed to me in unit test.

My question is from Testing topic in section Validation of Embedded Systems

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The correct choice is (d) test pattern

The best I can explain: The test pattern generation is basically based on the fault models and this type of model is also known as the stuck-at model. These test patterns are based on a certain assumption, hence it is known as the stuck-at model.

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