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How is the quality of the test pattern evaluated?

(a) fault coverage

(b) test pattern

(c) size of the test pattern

(d) number of errors

The question was posed to me by my college director while I was bunking the class.

The doubt is from Testing topic in portion Validation of Embedded Systems

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Correct answer is (a) fault coverage

The explanation is: The quality of the test pattern can be evaluated on the basis of the fault coverage. It is the percentage of potential faults that can be found for a given test pattern set, that is fault coverage equals the number of detectable faults for a given test pattern set divided by the number of faults possible due to the fault model.

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