Question

Which of the following is based on fault models?

(a) alpha-numeric pattern

(b) test pattern

(c) bit pattern

(d) parity pattern

This question was posed to me in an interview for internship.

I'd like to ask this question from Testing in section Validation of Embedded Systems

Answer 1

The correct choice is (b) test pattern

Easiest explanation: The test pattern generation is normally based on the fault models and this model is also known as the stuck-at model. The test pattern is based on a certain assumption, that is why it is called the stuck-at model.