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Which of the following have flip-flops which are connected to form shift registers?

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Which of the following have flip-flops which are connected to form shift registers?

(a) scan design

(b) test pattern

(c) bit pattern

(d) CRC

This question was addressed to me in an online interview.

Asked question is from Testing in division Validation of Embedded Systems

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The correct answer is (a) scan design

Best explanation: All the flip-flop storing states are connected to form a shift register in the scan design. It is a kind of test path.

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